Microvue |
 |
| |
Welcome
Microvue develops
software and hardware for RF and microwave device characterization. Our
products are used in both wired and wireless applications to characterize the
semiconductors essential to products such as cell phones, wireless LANs,
military radar, collision avoidance radar, and navigation systems.
|
| |
|
| Wavevue
Measurement Studio |
Looking for
Wavevue Software?
Contact
Microvue and our sales team will help you determine the
solution that is appropriate for your needs.
sales@microvueinc.com
Complete
Solutions can still be provided though our strategic
partner, Cascade Microtech, Beaverton Oregon
http://www.cmicro.com

|
Wavevue
Measurement Studio is an
integrated measurement solution that unifies RF/microwave and DC
measurements in one software application. Modules are purchased
separately to enable custom configurations for each customer
solution. In addition to the modules listed below, Microvue can also
be contracted for custom development of new measurement modules to
fit your needs.
-
S-Parameters
(2 Port and Multiport)
-
DC Bias and Curves
-
I-V Measurements
-
C-V Measurements
-
Power
Measurements (Pout, Efficency, ACPR, IMX, ...)
-
Noise
Measurements (50Ohm NF)
-
Dynamic I-V
Measurements
-
Wafer Prober Control
-
Compatible with
Nucleus and WinCal (Cascade Microtech)
-
Exports to ADS and
ICCAP (Agilent Technologies)
-
Conditional
branching and DLL capability
-
Switch matrix
control
Contact Microvue
for more information on Wavevue Measurement Studio and/or custom
solutions and consulting.
|
| |
| Downloads
and Support |
Microvue Inc.
73 Princeton St.
Suite 308
North Chelmsford,
MA.01863
(978)-251-0456
See map...

|
Software Updates
Documentation
Presentations
Access to this
area is controlled and available only to users who have an up to
date support contract.
Please contact
support@microvueinc.com
to get a new username and password as the old user names and
passwords are no longer valid.
|
| |
Copyright 1995-2008 Microvue Inc.
|